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0 索取号:R-39/E20001/1997 作者: 出版社:Berlin ; New York : Springer, c1997.
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0 索取号:TP391.4-532/E996/5 作者:International Conference on Computer Vision (5th : 1995 : Cambridge、 Mass.)、IEEE Computer Society Technical Committee On Pattern Analysis and Machine Intelligence.、 出版社:Los Alamitos, California : IEEE Computer Society Press, c1995.
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0 索取号:TP302.2-532/E20011/1993 作者: 出版社:Berlin ; New York : Springer-Verlag, c1994.
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0 索取号:TP18-532/E20071/7 作者:International Conference on Tools for Artificial Intelligence (7th : 1995 : Herndon、 Va.)、IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.、State University of New York at Binghamton.、 出版社:Los Alamitos, Calif. : IEEE Computer Society Press, c1995.
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0 索取号:TP18-532/E9915/11 作者:Conference on Artificial Intelligence for Applications (11th : 1995 : Los Angeles、 Calif.)、IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.、 出版社:Los Alamitos, Calif. : IEEE Computer Society Press, c1995.
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0 索取号:F241.33/E991 作者: 出版社:Aldershot, England ; Brookfield, USA : E. Elgar, c1995.
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0 索取号:F133.91/E991 作者: 出版社:Boulder, CO : Westview Press, 1997.
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0 索取号:TP18-532/E9910/7 作者:Portuguese Conference on Artificial Intelligence (7th : 1995 : Funchal、 Madeira Island、 Portugal)、Mamede、 Nuno J. (Nuno Joao)、Pinto-Ferreira、 Carlos.、 出版社:Switzerland : Scitec Publications, c1996.
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0 索取号:F224-39/E995 作者: 出版社:Boston, Mass : Kluwer Academic, c1996.
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0 索取号:K712/E992 作者: 出版社:Lexington, Mass. : D.C. Heath, c1993.
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0 索取号:O647/E992 作者:Davison、 Sydney G.、Stęślicka、 Maria.、 出版社:Oxford : Clarendon Press ; New York : Oxford University Press, 1992, 1996.
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0 索取号:R-39/E20001/1995 作者: 出版社:Berlin ; New York : Springer, c1995.
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0 索取号:Q28/E9910 作者: 出版社:New York : Springer-Verlag, c1995.
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0 索取号:K152/E992 作者:Prados、 Hohn.、 出版社:New York : Random House, c1995.
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0 索取号:G649.712.8/E901 作者: 出版社:Princeton, N.J. : Peterson's Guides, 1987.
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0 索取号:TP391-53/E901/1994.2 作者:IEEE Computer Society Conference on Computer Vision and Pattern Recognition (1994 : Seattle、 Wash.)、IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.、 出版社:Los Alamitos, Calif. : IEEE Computer Society Press, c1994.
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